| Day 0: May 28, 2007
|
| 18:00 - 20:00 | Opening Reception and Check In |
| Day 1: May 29, 2007
|
| 07:30 - 08:30 | Breakfast |
| 08:30 - 10:00 | Session 1: Sensor/Measurement Selection |
| 10:00 - 10:30 | Break |
| 10:30 - 12:00 | Session 2: Dynamic Systems |
| 12:00 - 13:00 | Lunch |
| 13:00 - 14:00 | Invited Talk: George Vachtsevanos - Georgia Institute of Technology |
| 14:00 - 14:15 | Break |
| 14:15 - 15:45 | Session 3: Software Systems |
| 15:45 - 16:00 | Break |
| 16:00 - 17:30 | Poster Session |
| Day 2: May 30, 2007
|
| 07:30 - 08:30 | Breakfast |
| 08:30 - 10:00 | Session 1: DES Diagnosis |
| 10:00 - 10:30 | Break |
| 10:30 - 12:00 | Session 2: Applications |
| 12:00 - 13:00 | Lunch |
| 13:00 - 14:30 | Panel Discussion |
| 14:30 - 14:45 | Break |
| 14:45 - 15:45 | Session 3: Testing |
| 15:45 - 16:00 | Break |
| 16:00 - 17:00 | Business Meeting |
| 17:00 - 18:15 | Break |
| 18:15 - 22:00 | Social Event: General Jackson Dinner Cruise |
| Day 3: May 31, 2007
|
| 07:30 - 08:30 | Breakfast |
| 08:30 - 10:00 | Session 1: Methods |
| 10:00 - 10:30 | Break |
| 10:30 - 12:00 | Session 2: Fault Detection/FDI |
| 12:00 - 13:00 | Lunch |
| 13:00 - 14:00 | Invited Talk: Kirby Keller - Boeing |
| 14:00 - 14:15 | Break |
| 14:15 - 15:45 | Session 3: Temporal Reasoning |
| 15:45 - 16:00 | Break |
| 16:00 - 17:30 | Poster Session |
